Signatone S-1060R Micro Manipulator Probe Station

Description:

The Signatone S-1060R Probe Station is used for precision electrical testing and semiconductor wafer probing. Commonly installed in research laboratories and semiconductor testing facilities, it provides accurate probe positioning for electrical measurements and may be configured with the Interlink 400 system. Maintenance teams use this probe station to support reliable device testing and failure analysis.

Applications:

The Signatone S-1060R Probe Station is designed for semiconductor wafer testing, electrical characterization, and device inspection. It is commonly used in research laboratories, semiconductor manufacturing, and quality control environments.

Technical Specifications:

• Manufacturer Part Number (MPN): S-1060R
• Brand: Signatone
• Product Type: Probe Station
• Configuration: Manual Probe Station
• Accessory/System: Interlink 400
• Application: Semiconductor Wafer Testing
• Measurement Capability: Electrical Device Characterization
• Sample Compatibility: Semiconductor Wafers and Electronic Devices
• Installation: Laboratory and Semiconductor Test Environments

Common Replacements:

• Signatone Manual Probe Station
• Semiconductor Wafer Probe Station
• Electrical Device Probe Station