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Ted Pella Inc. 61070 Electron Microscope Aperture

Ted Pella Inc. 61070 Electron Microscope Aperture

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Brand: Ted

Description:

Description:

The Ted Pella Inc. 61070 Electron Microscope Aperture is used in transmission and scanning electron microscopy systems to control electron beam diameter, improve image resolution, and optimize beam current for high-precision analysis. Commonly installed in electron microscopes used for materials science, semiconductor inspection, nanotechnology, metallurgy, and life science research laboratories requiring accurate beam alignment and stable imaging performance. Maintenance engineers, microscopy laboratories, research institutions, and instrument service technicians use this aperture for routine replacement, preventive maintenance, instrument calibration, and restoration of optimal electron beam performance.

Applications:

The Ted Pella Inc. 61070 Electron Microscope Aperture is designed for use in electron microscope column assemblies where precise electron beam shaping and current control are essential. It is widely used in transmission electron microscopes (TEM), scanning electron microscopes (SEM), focused ion beam (FIB) systems, microprobe instruments, universities, industrial quality control laboratories, and research facilities requiring consistent beam stability and high-resolution imaging.

Technical Specifications:

• Manufacturer: Ted Pella Inc.
• Manufacturer Part Number (MPN): 61070
• Product Type: Electron Microscope Aperture
• Aperture Diameter: 70 µm
• Aperture Style: Precision Electron Beam Aperture
• Material: Platinum-Iridium (95:5)
• Outside Diameter: 3 mm
• Disc Thickness: 0.25 mm
• Aperture Tolerance: ±2 µm (11–70 µm aperture range)
• Compatible Equipment: Transmission Electron Microscopes (TEM) and Scanning Electron Microscopes (SEM) using 3 mm aperture holders
• Function: Electron Beam Limiting, Beam Alignment, Beam Current Control, and Resolution Enhancement
• Installation: Direct Replacement Aperture Disc
• Typical Applications: Electron Microscopy, Semiconductor Inspection, Materials Science, Nanotechnology, and Scientific Research Laboratories

Common Replacements:

• Ted Pella Inc. 61050 Electron Microscope Aperture 50 µm
• Ted Pella Inc. 61100 Electron Microscope Aperture 100 µm
• Ted Pella Inc. 61030 Electron Microscope Aperture 30 µm

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