Ted Pella Inc. 61300 Electron Microscope Aperture
Ted Pella Inc. 61300 Electron Microscope Aperture
Description:
Description:
The Ted Pella Inc. 61300 Electron Microscope Aperture is used in transmission and scanning electron microscopy systems to control electron beam diameter, optimize beam current, and improve image quality for high-precision analysis. Commonly installed in electron microscopes used for materials science, semiconductor inspection, nanotechnology, metallurgy, and life science research laboratories requiring accurate beam alignment and stable imaging performance. Maintenance engineers, microscopy laboratories, research institutions, and instrument service technicians use this aperture for routine replacement, preventive maintenance, instrument calibration, and restoration of optimal electron beam performance.
Applications:
The Ted Pella Inc. 61300 Electron Microscope Aperture is designed for use in electron microscope column assemblies where precise electron beam shaping and current control are essential. It is widely used in transmission electron microscopes (TEM), scanning electron microscopes (SEM), focused ion beam (FIB) systems, electron microprobes, industrial quality control laboratories, universities, and research facilities requiring consistent beam stability and high-resolution imaging.
Technical Specifications:
• Manufacturer: Ted Pella, Inc.
• Manufacturer Part Number (MPN): 61300
• Product Type: Electron Microscope Aperture
• Aperture Diameter: 300 µm
• Aperture Style: Precision Electron Beam Aperture
• Material: Platinum-Iridium (95:5)
• Outside Diameter: 3.04 mm
• Disc Thickness: 0.25 mm
• Aperture Hole Tolerance: ±5 µm (71–300 µm aperture range)
• Compatible Equipment: Transmission Electron Microscopes (TEM) and Scanning Electron Microscopes (SEM) using 3.04 mm aperture holders
• Function: Electron Beam Limiting, Beam Alignment, Beam Current Control, and Resolution Enhancement
• Installation: Direct Replacement Aperture Disc
• Typical Applications: Electron Microscopy, Semiconductor Inspection, Materials Science, Nanotechnology, and Scientific Research Laboratories
Common Replacements:
• Ted Pella Inc. 61250 Electron Microscope Aperture 250 µm
• Ted Pella Inc. 61400 Electron Microscope Aperture 400 µm
• Ted Pella Inc. 61150 Electron Microscope Aperture 150 µm
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